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Resistive switching characteristics of AL2O3/TiO2 bilayer ReRAM dependent on Al2O3 Thickness

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Resistive switching characteristics of AL2O3/TiO2 bilayer ReRAM dependent on Al2O3 Thickness
저자
전형탁
발행일
2012-10-31
학회명
AVS 59th International Symposium & Exhibition
개최지
Tampa, Florida, USA

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