ScholarWorks@한양대학교

상세 보기

Study on Defect States in Proton Irradiated Si Diode by Using Deep Level Transient Spectroscopy

  • 김은규
제목
Study on Defect States in Proton Irradiated Si Diode by Using Deep Level Transient Spectroscopy
저자
김은규
발행일
2005-07-26
학회명
23rd Inter. Conf. on Defects in Semiconductors(ICDS-23)
개최지
Awaji Island, Japan

ScholarWorks@한양대학교

(04763) 서울특별시 성동구 왕십리로 222 Tel. +82-2-2220-1370 +82-2-2220-1366

COPYRIGHT © 한양대학교 All Rights Reserved.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.

You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.