Nitrogen MeV-Ion-Induced Extended Defects and the File-up of Interstitial Oxygen in Silicon wafer

  • 박재근
제목
Nitrogen MeV-Ion-Induced Extended Defects and the File-up of Interstitial Oxygen in Silicon wafer
저자
박재근
발행일
2000-11-01
학회명
International Symposium on the Physics of Semiconductors and Applications-2000
개최지
제주도