Influence of oxygen ion drift on a negative difference behavior in a reset process of bipolar resistive switching

  • Bae, Yoon Cheol; 
  • Lee, Ah Rahm; 
  • Baek, Gwang Ho; 
  • Chung, Je Bock; 
  • Kim, Tae Yoon; 
  • ... Hong, Jin Pyo; 
  • 외 1명
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초록

We present the oxygen ion drift-based resistive switching features of TiOx/TiOy bi-layer homo-junctions. The TiOx layer in this bi-layer configuration was designed to have a stoichiometric chemical composition of TiO2, while the TiOy layer was designed to have a non-stoichiometric chemical composition. X-ray photoelectron spectroscopy measurements were carried out before and after electro-forming to determine the role of non-lattice oxygen content. Variation of the oxygen ion content in the TiO2 layers resulted in changes in the on/off ratio and increased the non-lattice oxygen content. A possible switching mechanism based on oxygen ion content is discussed.

키워드

XPS; Resistive switching; Non-lattice oxygen; ReRAM; MEMORY
제목
Influence of oxygen ion drift on a negative difference behavior in a reset process of bipolar resistive switching
저자
Bae, Yoon Cheol; Lee, Ah Rahm; Baek, Gwang Ho; Chung, Je Bock; Kim, Tae Yoon; Im, Hyun Sik; Hong, Jin Pyo
DOI
10.1016/j.cap.2013.11.029
발행일
2014-03
유형
Article
저널명
Current Applied Physics
권
14
호
3
페이지
355 ~ 358