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Influence of oxygen ion drift on a negative difference behavior in a reset process of bipolar resistive switching
- Bae, Yoon Cheol;
- Lee, Ah Rahm;
- Baek, Gwang Ho;
- Chung, Je Bock;
- Kim, Tae Yoon;
- ... Hong, Jin Pyo;
- 외 1명
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1초록
We present the oxygen ion drift-based resistive switching features of TiOx/TiOy bi-layer homo-junctions. The TiOx layer in this bi-layer configuration was designed to have a stoichiometric chemical composition of TiO2, while the TiOy layer was designed to have a non-stoichiometric chemical composition. X-ray photoelectron spectroscopy measurements were carried out before and after electro-forming to determine the role of non-lattice oxygen content. Variation of the oxygen ion content in the TiO2 layers resulted in changes in the on/off ratio and increased the non-lattice oxygen content. A possible switching mechanism based on oxygen ion content is discussed.
키워드
XPS; Resistive switching; Non-lattice oxygen; ReRAM; MEMORY
- 제목
- Influence of oxygen ion drift on a negative difference behavior in a reset process of bipolar resistive switching
- 저자
- Bae, Yoon Cheol; Lee, Ah Rahm; Baek, Gwang Ho; Chung, Je Bock; Kim, Tae Yoon; Im, Hyun Sik; Hong, Jin Pyo
- 발행일
- 2014-03
- 유형
- Article
- 권
- 14
- 호
- 3
- 페이지
- 355 ~ 358