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Photo-induced Current Transient Defect Analyses of oxide Semiconductor Materials by artificial interlligence 1D Convolutional neural networks
- 제목
- Photo-induced Current Transient Defect Analyses of oxide Semiconductor Materials by artificial interlligence 1D Convolutional neural networks
- 저자
- 홍진표
- 발행일
- 2024-10-23
- 학회명
- 2024 KPS Fall meeting
- 개최지
- 여수