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Electrical Bistability Mechanisms of Organic Bistable Devices Fabricated Utilizing Ni1-xFex Self-Assembled Nanoparticles Embedded in a Polyimide Layer
- Cho, Sung Hwan;
- Kim, Won Tae;
- Jung, Jae Hun;
- Kim, Tae Whan;
- Yoon, Chong Seung;
- 외 1명
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1초록
Current-voltage (I-V) measurements on Al/Ni1-xFex nanoparticles embedded in polyimide/Al devices at 300 K showed a current bistability due to the existence of Ni1-xFex nanoparticles. The ON/OFF current ratio for the fabricated devices was about 10(2). The retention time data of the devices demonstrated charge trapping and detrapping processes. Carrier transport mechanisms of the devices are described on the basis of the I-V experimental and fitting results.
키워드
CONJUGATED POLYMER; MEMORY DEVICE; THIN-FILM; SYSTEM; OXIDE
- 제목
- Electrical Bistability Mechanisms of Organic Bistable Devices Fabricated Utilizing Ni1-xFex Self-Assembled Nanoparticles Embedded in a Polyimide Layer
- 저자
- Cho, Sung Hwan; Kim, Won Tae; Jung, Jae Hun; Kim, Tae Whan; Yoon, Chong Seung; Kim, Young-Ho
- 발행일
- 2010-01
- 유형
- Article; Proceedings Paper
- 권
- 49
- 호
- 1
- 페이지
- 1 ~ 4