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- 제목
- Defect formation mechanisms in the interfacial layer due to thermal treatment between the ZnO thin film and the Si substrate
- 저자
- 김태환
- 발행일
- 2006-12-19
- 학회명
- Asian-Pacific Conference on Surface Science & Engineering (SSE2006)
- 개최지
- Lam Woo International Conference Center, Hong Kong Baptist University, Hong Kong