Defect formation mechanisms in the interfacial layer due to thermal treatment between the ZnO thin film and the Si substrate

  • 김태환
제목
Defect formation mechanisms in the interfacial layer due to thermal treatment between the ZnO thin film and the Si substrate
저자
김태환
발행일
2006-12-19
학회명
Asian-Pacific Conference on Surface Science & Engineering (SSE2006)
개최지
Lam Woo International Conference Center, Hong Kong Baptist University, Hong Kong