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Dependency of annealing temperature on trap density of SOI wafers in Pseudo MOS Transistor

  • 박재근
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Dependency of annealing temperature on trap density of SOI wafers in Pseudo MOS Transistor
저자
박재근
발행일
2005-04-22
학회명
한국물리학회
개최지
이화여자대학교

ScholarWorks@한양대학교

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