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- 제목
- Reliability Degeneration Mechanisms of the 20-nm Flash Memories due to the Word line stress
- 저자
- 김태환
- 발행일
- 2014-11-06
- 학회명
- The 12th International Conference on Nano Science and Nano Technology
- 개최지
- Mokpo National University & Shangria Beach Hotel, Korea