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Temperature Dependence of Reliability for Magnetic Tunnel Junctions with a Thin MgO Dielectric Film and TCAD modeling
- 제목
- Temperature Dependence of Reliability for Magnetic Tunnel Junctions with a Thin MgO Dielectric Film and TCAD modeling
- 저자
- 송윤흡
- 발행일
- 2016-02-20
- 학회명
- The International Conference on Engineering and Applied Sciences 2016
- 개최지
- Singapore