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초록
Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in CdxZn1-xTe epilayers grown on GaAs (100) substrates. The SADP showed superstructure reflections with symmetrical intensity, and the high-resolution TEM (HRTEM) micrographs showed doublet periodicity in the contrast of the {100} lattice planes. The results of the SADP and the HRTEM measurements showed a Cu3Au-type ordered structure was formed in the Cd(x)Z(1-x)Te epilayer. The present results can help improve understanding of the Cu3Au-type ordered structures in CdxZn1-xTe epilayers grown on GaAs substrates.
키워드
semiconductor; transmission electron microscopy; order-disorder effects; VAPOR-PHASE EPITAXY
- 제목
- Existence of a Cu3Au-type ordered structure in CdxZn1-xTe epilayers grown on (100)GaAs substrates
- 저자
- Lee, Hoseong; Yi, Seonghoon; Kim, Taewhan; Park, Yujin; Lee, Jeongyong; Kwon, Myoung-seok; Park, Hong-lee
- 발행일
- 2006-01
- 유형
- Article
- 권
- 137
- 호
- 1-2
- 페이지
- 70 ~ 73