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Evaluation of interface trap density between MoS2 layer and dielectrics in suspended MoS2 transistor

  • 김은규
제목
Evaluation of interface trap density between MoS2 layer and dielectrics in suspended MoS2 transistor
저자
김은규
발행일
2015-04-24
학회명
2015년 한국물리학회 봄학술논문발표회
개최지
대전컨벤션센터

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