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BLUNTNESS MEASUREMENT OF A BERKOVICH INDENTER
- Lee, Yun-Hee;
- Yoo, Byung-Gil;
- Jang, Jae-Il
WEB OF SCIENCE
1SCOPUS
1초록
Indenter blunting is inevitable in nanoindentations and results in unexpected contact properties. Both relaxation of the indentation size effects and deepening of the substrate effects under a blunted indenter cause a change of the bathtub-shaped hardness with indentation depth in a soft film on hard substrate. Thus an identification of three-dimensional morphology of an indenter apex is necessary for precise measurements of hardness in thin films. We observed an actual Berkovich indenter using an atomic force microscope (AFM). Through a quantitative analysis on the AFM image, data pairs of contact area versus contact depth were obtained; curvature radius of the apex was estimated by searching a sphere well-fitted to the indenter apex morphology. The estimated curvature radius and blunted height were 1043.9 +/- 50.9 nm and 44.4 nm, respectively. By comparing with the result from the modified Kick's law, both blunted heights were comparable each other within a 7 nm difference. This confirms validity of the direct observation method with the AFM.
키워드
- 제목
- BLUNTNESS MEASUREMENT OF A BERKOVICH INDENTER
- 저자
- Lee, Yun-Hee; Yoo, Byung-Gil; Jang, Jae-Il
- 발행일
- 2011-12
- 유형
- Article; Proceedings Paper
- 권
- 25
- 호
- 31
- 페이지
- 4273 ~ 4276