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Origin of gate-bias-thermal instabilities in amorphous metal oxide thin-film transistors
- 제목
- Origin of gate-bias-thermal instabilities in amorphous metal oxide thin-film transistors
- 저자
- 정재경
- 발행일
- 2017-02-24
- 학회명
- The 12th International Thin-Film-Transistor Conference (ITC 2017)
- 개최지
- Austin, USA