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Electrical Stability Enhancement of the Thin Film Transistor with the Back-channel Deposited by Co-sputtering Amorphous In-Ga-Zn-O and SiOx
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Electrical Stability Enhancement of the Thin Film Transistor with the Back-channel Deposited by Co-sputtering Amorphous In-Ga-Zn-O and SiOx
저자
박재근
발행일
2013-10-30
학회명
224th ECS Meeting
개최지
Hilton San Francisco
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