Adjacent Image Augmentation and Its Framework for Self-Supervised Learning in Anomaly Detection

초록

Anomaly detection has gained significant attention with the advancements in deep neural networks. Effective training requires both normal and anomalous data, but this often leads to a class imbalance, as anomalous data is scarce. Traditional augmentation methods struggle to maintain the correlation between anomalous patterns and their surroundings. To address this, we propose an adjacent augmentation technique that generates synthetic anomaly images, preserving object shapes while distorting contours to enhance correlation. Experimental results show that adjacent augmentation captures high-quality anomaly features, achieving superior AU-ROC and AU-PR scores compared to existing methods. Additionally, our technique produces synthetic normal images, aiding in learning detailed normal data features and reducing sensitivity to minor variations. Our framework considers all training images within a batch as positive pairs, pairing them with synthetic normal images as positive pairs and with synthetic anomaly images as negative pairs. This compensates for the lack of anomalous features and effectively distinguishes between normal and anomalous features, mitigating class imbalance. Using the ResNet50 network, our model achieved perfect AU-ROC and AU-PR scores of 100% in the bottle category of the MVTec-AD dataset. We are also investigating the relationship between anomalous pattern size and detection performance.

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