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Influence of Interface Roughness Scattering on Electron Mobility for Strained Si Grown on SiGe-on-Insulator Using Monte Carlo Simulation

  • 박재근
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Influence of Interface Roughness Scattering on Electron Mobility for Strained Si Grown on SiGe-on-Insulator Using Monte Carlo Simulation
저자
박재근
발행일
2005-04-22
학회명
한국물리학회
개최지
이화여자대학교

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