Progress in Materials Science

ISSN
P 0079-6425 E 1873-2208
출판사
Pergamon Press Ltd. Elsevier
국가
ENGLAND
발행 상태
활성

데이터베이스 수록 정보

JCR 1997-2019 (23년)
SCI 2010-2019 (10년)
SCIE 2010-2021 (12년)
Scopus 2017-2020 (4년)
SJR 1999-2019 (21년)

전체 33건 중 1번부터 10번까지의 결과를 표시합니다.

2026
Article

Nonzero-aware PE Line Partitioning for Improved Bandwidth Utilization in DRAM Bandwidth-scalable SpMV Accelerators

  • 2026-06
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • 대한전자공학회
Article

Resistor-BJT-less PTAT Current Generator with Single Threshold MOSFET

  • Uhm, Donghyun
  • Kim, Kwanwoo
  • Kim, Hojun
  • Park, Himchan
  • Yang, Jun-Hyeok
  • ... Lim, Jaemyung
  • 2026-02
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
2025
Article

Hardware-software Co-design for Vector Similarity Search on HBM-PIM

  • Kim, Nahyeon
  • Kim, Sujin
  • Jung, Min
  • Noh, Haechannuri
  • Kim, Ji-Hoon
  • 2025-12
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • 대한전자공학회
Article

A 400-MS/s 2-b/cycle Second-order Noise-shaping SAR ADC Using FIA-based Ring Amplifier

  • 2025-08
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
Article

Fault-tolerant GEMM Acceleratorbased on Microarchitectural Fault Analysis for Resource-constrained Devices

  • Park, Sunyoung
  • Yang, Hannah
  • Kim, Hana
  • Kim, Hyunji
  • Kim, Ji-Hoon
  • 2025-06
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
Article

Thermal Analysis of Indirect Double-sided Cooling Power Modules Considering the Impact of ThermalInterface Material Characteristics

  • 2025-04
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
2024
Article

A 24-Gb/s PAM-4 Tailless Current-mode Driver with Output Impedance Enhancing Technique in 14-nm FinFET

  • 2024-12
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
Article

Annealing Effects on Charge Trap Flash with TAHOS Structure

  • Song, Min Suk
  • Hwang, Hwiho
  • Yu, Junsu
  • Hwang, Sungmin
  • Kim, Hyungjin
  • 2024-08
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
Article

A 2-GS/s 6-bit Single-channel Speculative Loop-unrolled SAR ADC with Low-overhead Comparator Offset Calibration in 28-nm CMOS

  • Lee, Eunsang
  • Lee, Sanghun
  • Pyo, Changhyun
  • Kim, Hyunseok
  • Han, Jaeduk
  • 2024-08
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
Article

A Third-order Noise-shaping SAR ADC using PVT-insensitive Voltage-time-voltage Converter and Mismatch-Shaping

  • 2024-08
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
1