Performance Evaluation of Scaled ZnO Stacked Nanosheet Channel Ternary Field Effect Transistor

  • Lee, Ho-In
  • Kim, So-Young
  • Kim, Seung-Mo
  • Lee, Yongsu
  • Lee, Hae-Won
  • ... Sung, Myung Mo
  • 외 3명
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초록

Ternary logic device technologies have been actively researched due to the potential benefits such as lower power consumption, smaller device count, smaller area, and higher data processing density, compared to their binary counterparts. In this work, scaling prospect of ZnO stacked nanosheet channel ternary field effect transistor has been investigated. The benefits of scaling geometric parameters such as gate dielectric thickness, channel length, and source/drain charge injection area are examined. 90 % lower power consumption in the intermediate state is achieved at Vdd = 1 V with a noise margin of 130 mV, compared to other emerging ternary logic devices. The feasibility for stable ternary circuit operation is confirmed as well.

키워드

Zinc oxideII-VI semiconductor materialsLogic gatesDielectricsMultivalued logicThreshold voltagePerformance evaluationIntermediate currentintermediate statelow powerternary logicquantum confinement effectZnO SNTFETDEVICEVOLTAGEeLow PowerPerformances evaluationQuantum confinement effectsTernary logicZnO SNTFETII-VI semiconductors
제목
Performance Evaluation of Scaled ZnO Stacked Nanosheet Channel Ternary Field Effect Transistor
저자
Lee, Ho-InKim, So-YoungKim, Seung-MoLee, YongsuLee, Hae-Won Yu, Sung HoSung, Myung Mo Hwang, Hyeon JunLee, Byoung Hun
DOI
10.1109/LED.2021.3139225
발행일
2022-02
유형
Article
저널명
IEEE Electron Device Letters
43
2
페이지
323 ~ 326