상세 보기
Effect of High Pressure Annealing on the Reliability of FDSOI TUnneling FET
- 제목
- Effect of High Pressure Annealing on the Reliability of FDSOI TUnneling FET
- 저자
- 최창환
- 발행일
- 2017-09-21
- 학회명
- International Conference on Solid State Devices and Materials (SSDM)
- 개최지
- Sendai, Japan