Mixed mode fracture toughness of epoxy molding compound/ printed circuit board interface of semiconductor packages with respect to temperature and moisture

Mixed mode fracture toughness of epoxy molding compound/printed circuit board interface of semiconductor packages with respect to temperature and moisture
  • Um, Hui-Jin
  • Lee, Se-Min
  • Lee, Dae-Woong
  • Ha, Sangyul
  • Kim, Hak-Sung
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초록

Interfacial delamination is a critical factor for dissimilar bi-material interfaces in terms of structural mechanical behavior and reliability. In this study, the mixed mode interfacial fracture toughness of a thin epoxy molding compound/printed circuit board bilayer with different mixities was measured via the asymmetric double cantilever beam test with a reinforced metal jig. Additionally, mode II fracture toughness properties were measured through the end notched flexure test. All tests were performed under various temperature and moisture absorption conditions below 100celcius/85 %RH. Then, a finite element simulation was performed with the cohesive zone model technique to validate the experimentally measured fracture toughness values by comparing the load-displacement curves from the experiment and simulation. Additionally, the single leg beam test and its finite element simulation were conducted and compared for validation of the measured mixed mode fracture toughness values. It was demonstrated that the developed mixed mode fracture toughness measurement method could provide accurate fracture toughness, which could effectively predict the overall load-displacement curve and damage propagation behavior.

키워드

Mixed-mode delaminationSemiconductor packagesAsymmetric double cantilever beam (ADCB)testEnd notched flexure (ENF) testDELAMINATION GROWTHSIMULATIONADHESIONCRACK
제목
Mixed mode fracture toughness of epoxy molding compound/ printed circuit board interface of semiconductor packages with respect to temperature and moisture
제목 (타언어)
Mixed mode fracture toughness of epoxy molding compound/printed circuit board interface of semiconductor packages with respect to temperature and moisture
저자
Um, Hui-JinLee, Se-MinLee, Dae-WoongHa, SangyulKim, Hak-Sung
DOI
10.1016/j.engfracmech.2023.109429
발행일
2023-09
유형
Article
저널명
Engineering Fracture Mechanics
289
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