김학성 프로필 사진

김학성

Kim, Hak Sung

공과대학

기계공학부

Scopus ORCID Research Gate

연구분야

  • Composite Materials, 
  • Semiconductor packaging, 
  • Terahertz non-destructive inspection, 
  • 반도체 패키징, 
  • 복합재료, 
  • 테라헤르츠 비파괴 검사

자료 필터

자료유형

발행연도

2010 ~ 2026
2010 2026

키워드

언어

전체 750건 중 1번부터 10번까지의 결과를 표시합니다.

2026
Article

Anisotropic viscoelastic properties of prepreg and their influence on warpage of thin PCB substrates

  • Kumar, Sanjay ; 
  • Yoo, Woong-Kyoo ; 
  • Kim, Jaesung ; 
  • Ahn, Chae-Young ; 
  • Kim, Jinwoong ; 
  • ... Kim, Hak-Sung ; 
  • 외 1명
  • 2026-12
  • Composites Part A: Applied Science and Manufacturing
  • Elsevier Ltd
Article

Decoupling PEG and chloride co-adsorption kinetics at copper/electrolyte interface during pattern-dependent electrodeposition

  • Cho, Sangmin ; 
  • Park, Jeongwoo ; 
  • Park, Sangmin ; 
  • Seol, Yulim ; 
  • Shim, Jihye ; 
  • ... Kim, Hak-Sung ; 
  • ... So, Hongyun
  • 2026-11
  • Applied Surface Science
  • Elsevier BV
Article

Integrated electrochemical characterization and finite element modeling for optimizing copper filling in through-glass Vias: Kinetic parameter extraction and profile prediction

  • Kim, Young-Woo ; 
  • Baek, Jeong-Hyeon ; 
  • Lee, Se-Min ; 
  • Park, Jong-Whi ; 
  • Lee, Ho-Jin ; 
  • ... So, Hong-Yun ; 
  • ... Kim, Hak-Sung ; 
  • 외 2명
  • 2026-09
  • Journal of Electroanalytical Chemistry
  • Elsevier BV
Article

Multi-physics coupled modeling of process-induced warpage in advanced fan-out wafer-level semiconductor packages

  • Baek, Jeong-Hyeon ; 
  • Song, Jun-Seop ; 
  • Yoo, Woong-Kyoo ; 
  • An, Woo-Jin ; 
  • Oh, Gyung-Hwan ; 
  • ... Kim, Hak-Sung
  • 2026-09
  • Journal of Manufacturing Processes
  • ELSEVIER SCI LTD
Article

Dry plasma-enhanced adhesion of Ti/Cu seed layers to ABF substrates for fine-pitch packaging reliability

  • Lee, Se-Min ; 
  • Um, Hui-Jin ; 
  • Jeon, Na-Hyun ; 
  • Rho, Hyun-Ji ; 
  • Jeong, Soon-Oh ; 
  • ... Kim, Hak-Sung ; 
  • 외 2명
  • 2026-08
  • Applied Surface Science
  • Elsevier BV
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