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Bias dependence of PBTI degradation mechanism in metal-oxide semiconductor field effect transistors with La-incorporated hafnium-based dielectric
- 제목
- Bias dependence of PBTI degradation mechanism in metal-oxide semiconductor field effect transistors with La-incorporated hafnium-based dielectric
- 저자
- 최창환
- 발행일
- 2011-06-23
- 학회명
- 17th Conference on Insulating Films on Semiconductors (INFOS)
- 개최지
- Grenoble, France