Dual Gate ZnO-Based Thin-Film Transistors Operating at 5 V: NOR Gate Application

  • Park, Chung Hoon
  • Lee, Kwang Hong
  • Oh, Min Suk
  • Lee, Kimoon
  • Im, Seongil
  • ... Sung, Myung Mo
  • 외 1명
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초록

We report on the fabrication of ZnO-based dual gate (DG) thin-film transistors (TFTs) with 20-nm-thick Al2O3 for both top and bottom dielectrics, which were deposited by atomic layer deposition on glass substrates at 200 degrees C. As characterized with single gate (SG), DG, and ground plane (GP) modes, our ZnO TFTs are well operated under 5 V. DG-mode TFT showed a field mobility of 0.38 cm(2)/V.s, a high saturation current of 6 mu A, and an on/off current ratio of similar to 10(6), while SG- and GP-mode TFTs showed a similar value of mobility but with lower current. Using DG and GP modes, NOR gate operation was well demonstrated.

키워드

Dual gate (DG)NOR logic gatethin-film transistors (TFTs)ZnODensity (specific gravity)Galerkin methodsLogic gatesSemiconducting organic compoundsSemiconducting zinc compoundsThin film devicesThin film transistorsTransistorsZinc oxidAtomic layersDual gate (DG)Field mobilitiesGround planesNOR gatesNOR logic gateOn/off current ratiosSaturation currentsSingle gatesThin-film transistors (TFTs)ZnOGate dielectrics
제목
Dual Gate ZnO-Based Thin-Film Transistors Operating at 5 V: NOR Gate Application
저자
Park, Chung HoonLee, Kwang HongOh, Min SukLee, KimoonIm, SeongilLee, Byoung HunSung, Myung Mo
DOI
10.1109/LED.2008.2007973
발행일
2009-01
유형
Article
저널명
IEEE Electron Device Letters
30
1
페이지
30 ~ 32