상세 보기
Reliability Prediction of Automotive SiC MOSFET Packages Based on Degradation of EMC Viscoelasticity and Interfacial Strength
- 제목
- Reliability Prediction of Automotive SiC MOSFET Packages Based on Degradation of EMC Viscoelasticity and Interfacial Strength
- 저자
- 김학성
- 발행일
- 2026-05-29
- 학회명
- The 2026 IEEE 76th Electronic Components and Technology Conference
- 개최지
- JW Marriott & The Ritz-Carlton Grande Lakes Resort, Orlando, Florida, USA