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Non-destructive Technique for Detection of Voids in the IC Package Using Terahertz-Time Domain Spectrometer
- 제목
- Non-destructive Technique for Detection of Voids in the IC Package Using Terahertz-Time Domain Spectrometer
- 저자
- 김학성
- 발행일
- 2015-05-18
- 학회명
- 17th International Conference on Nondestructive Testing and Evaluation
- 개최지
- Paris