Metals and Materials International

ISSN
P 1598-9623 E 2005-4149
출판사
대한금속·재료학회 The Korean Institute Of Metals And Meterials
국가
SOUTH KOREA
발행 상태
활성

데이터베이스 수록 정보

JCR 2003-2019 (17년)
KCI 2009-2019 (11년)
KCI 등재 2005-2021 (17년)
KCI 등재후보 2002-2004 (3년)
SCI 2010-2019 (10년)
SCIE 2010-2021 (12년)
Scopus 2017-2020 (4년)
SJR 1999-2019 (21년)

전체 65건 중 1번부터 10번까지의 결과를 표시합니다.

2026
Article

Memory Window Expansion in HfO2-Based FeFETs Through Trap-to-Dipole Conversion

  • Han, Changhyeon
  • Kwak, Been
  • Kim, Hyun-Min
  • Kwak, Sangeun
  • Kwon, Daewoong
  • 2026-05
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Crystalline IGO TFTs with High Reliability under DRAM-Compatible 600 °C N2 Thermal Budgets

  • Oh, Jeong Eun
  • Kim, Nahyun
  • Chae, Jiwon
  • Cho, Min Hee
  • Ha, Daewon
  • ... Jeong, Jae Kyeong
  • 2026-05
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Band Engineering of Gate Interlayer for Low-voltage Operation and Enhanced Reliability in Gate-injection Type FeFETs

  • Kim, Hoon
  • Kim, Giuk
  • Choi, Hyojun
  • Joh, Hongrae
  • Kang, Hyunjun
  • ... Ahn, Jinho
  • 외 6명
  • 2026-04
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

IGZO/PbS QD/Ga2O3-Based Optical Synapse Transistors with High PPF for NIR Detection

  • 2026-01
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2025
Article

Highly Uniform and Flicker-Free Pixel Circuit for Wide Variable Refresh Rate AMOLED Displays

  • Wee, Sung-Min
  • Kim, Younsik
  • Chung, Kyung-Hoon
  • Yu, Byungchang
  • Lim, Jaemyung
  • 외 1명
  • 2025-12
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

In-situ Surface Energy Engineering for ALD-Derived Highly Reliable Top Gate In2O3 Thin-Film Transistors

  • Eun Oh, Jeong
  • Hee Choi, Cheol
  • Kim, Taikyu
  • Hun Yoon, Seong
  • Woong Bang, Seon
  • ... Kyeong Jeong, Jae
  • 외 5명
  • 2025-11
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Tailoring Crystal Growth via Sn Incorporation for High-Performance ALD IGO FETs

  • Kim, Gwang-Bok
  • Jeong, Joo-hee
  • Park, Soojin
  • Choi, Sunghyun
  • An, Jiseong
  • ... Jeong, Jae Kyeong
  • 외 1명
  • 2025-10
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

The Impact of Through Silicon Metal(TSM) contact on Performance and thermal reliability in CFET

  • 2025-10
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Enhancing Program Speed and Diminishing Read After Write Delay by Metal Work Function Engineering

  • Shin, Seokjoong
  • Kim, Giuk
  • Choi, Hyojun
  • Park, Sanghyun
  • Seo, Kwangyou
  • ... Ahn, Jinho
  • 외 4명
  • 2025-08
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Imprinted Antiferroelectric with Low Damage Process for High Performance Negative Capacitance NAND Flash Memory

  • Lee, Sangho
  • Kim, Giuk
  • Nam, Yunseok
  • Jeong, Yeongseok
  • Kim, Taeho
  • ... Ahn, Jinho
  • 외 3명
  • 2025-04
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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