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Journal of Materials Science and Technology
ISSN
P 1005-0302
출판사
Allerton Press Inc.
국가
CHINA
발행 상태
활성
데이터베이스 수록 정보
JCR 1997-2019 (23년)
SCIE 2010-2021 (12년)
Scopus 2017-2020 (4년)
SJR 1999-2019 (21년)
전체 20건 중 1번부터 10번까지의 결과를 표시합니다.
2025
Article
A review in thermal management for advanced chip packaging from chip to heat sink
- Kim, Minsoo ;
- Kim, Jaehyun ;
- Park, Woosung ;
- Kang, Joon Sang
- 2025-07
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2024
Article
Aspect ratio-dependent leaning of a block array in 3D NAND flash memory
- Kim, Beomsu ;
- Yoon, Dong-Gwan ;
- Sim, Jae-Min ;
- Song, Yun-Heub
- 2024-07
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2023
Article
Mechanical stress in a tapered channel hole of 3D NAND flash memory
- Yoon, Dong Gwan ;
- Sim, Jae Min ;
- Song, Yun Heub
- 2023-04
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2022
Article
Expedient validation of LED reliability with anomaly detection through multi-output Gaussian process regression
- Lim, Sze Li Harry ;
- Duong, Pham Luu Trung ;
- Park, Hyunseok ;
- Raghavan, Nagarajan
- 2022-11
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
Article
Prognosis of LED lumen degradation using Bayesian optimized neural network approach
- Pugalenthi, Karkulali ;
- Lim, Sze Li Harry ;
- Park, Hyunseok ;
- Hussain, Shaista ;
- Raghavan, Nagarajan
- 2022-11
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2021
Article
Finite element analysis of moisture induced thermo-mechanical delamination of semiconductor packages considering in-situ moisture desorption during reflow process
- Hwang, Yeon-Taek ;
- Um, Hui-Jin ;
- Yu, Myeong-Hyeon ;
- Lee, Dae-Woong ;
- Lee, Mi-Jung ;
- ... Kim, Hak Sung
- 2021-06
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2020
Article
Assessing multi-output Gaussian process regression for modeling of non-monotonic degradation trends of light emitting diodes in storage
- Lim, Sze Li Harry ;
- Duong, Pham Luu Trung ;
- Park, Hyunseok ;
- Singh, Preetpal ;
- Tan, Cher ming ;
- 외 1명
- 2020-11
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2019
Article
Prognosis of power MOSFET resistance degradation trend using artificial neural network approach
- Pugalenthi, Karkulali ;
- Park, Hyunseok ;
- Raghavan, Nagarajan
- 2019-09
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
Article
Reliability analysis and design of a single diode solar cell model using polynomial chaos and active subspace
- Pham Luu Trung Duong ;
- Yang, Qing ;
- Park, Hyunseok ;
- Raghavan, Nagarajan
- 2019-09
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
Article
Effect of plasma treatment on adhesion strength and moisture absorption characteristics between epoxy molding compound/silicon chip (EMC/chip) interface
- Oh, Gyung-Hwan ;
- Joo, Sung-Jun ;
- Jeong, Jae-Woo ;
- Kim, Hak-Sung
- 2019-01
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
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