상세 보기
자료 필터
자료유형
발행연도
2006 ~ 2027
2006 2027
키워드
언어
전체 365건 중 181번부터 190번까지의 결과를 표시합니다.
2019
Conference
Reliability Prediction of Gate Dielectrics Based on Percolation Models Using Fractal Structure
- 2019-11-27
Conference
Estimating Remaining Useful Life of Turbofan Engines Using Denoising CNN for Multivariate Time-series Data
- 2019-11-27
Conference
Statistical Analysis Method for Assessing Drop-shock Reliability of OLED Module for Portable Devices
- 2019-11-27
Conference
Cascaded Convolutional Neural Network for Wafer Bin Map Defect Pattern Classification
- 2019-10-22
Article
Reliability assessment of a continuous-state fuel cell stack system with multiple degrading components
- Yuan, Tao ;
- Wu, Xinying ;
- Bae, Suk Joo ;
- Zhu, Xiaoyan
- 2019-09
- Reliability Engineering and System Safety
- ELSEVIER SCI LTD
Article
Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects
- Kim, Seong-Joon ;
- Kim, Man Soo ;
- Bae, Suk Joo
- 2019-09
- IEEE Access
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Step-down approach for wavelet thresholding
- Lim, M ;
- Mun, BM ;
- Bae, Suk Joo
- 2019-08
- Proceedings - 25th ISSAT International Conference on Reliability and Quality in Design
- International Society of Science and Applied Technologies
Conference
Integrated Fault Detection and Classification of Wafer Bin Maps Using Wavelet Spectrum
- 2019-07-23