안진호 프로필 사진

안진호

Ahn, Jinho

공과대학

신소재공학부

Web Of Science Scopus ORCID

연구분야

  • 재료공학

자료 필터

자료유형

발행연도

1995 ~ 2026
1995 2026

키워드

언어

전체 1,062건 중 111번부터 120번까지의 결과를 표시합니다.

2024
Article

Positive Interaction between Charge Trapping and Polarization Switching in Metal-Interlayer-Ferroelectric-Interlayer-Silicon (MIFIS) Ferroelectric Field-Effect Transistor

  • Choi, Hyojun ; 
  • Kim, Giuk ; 
  • Lee, Sangho ; 
  • Shin, Hunbeom ; 
  • Lim, Youngjin ; 
  • ... Ahn, Jinho ; 
  • 외 5명
  • 2024-12
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Damage mitigation as a strategy to achieve high ferroelectricity and reliability in hafnia for random-access-memory

  • Hwang, Junghyeon ; 
  • Shin, Hunbeom ; 
  • Kim, Chaeheon ; 
  • Ahn, Jinho ; 
  • Jeon, Sanghun
  • 2024-12
  • Journal of Materials Chemistry C
  • ROYAL SOC CHEMISTRY
Article

Kinetically Stabilized Hafnia Ferroelectric of Al-Doped HfO2 Film by Fast Ramping and Fast Cooling Process

  • Zhang, Lingwei ; 
  • Kim, Giuk ; 
  • Lee, Sangho ; 
  • Shin, Hunbeom ; 
  • Lim, Youngjin ; 
  • ... Ahn, Jinho ; 
  • 외 4명
  • 2024-12
  • IEEE Transactions on Electron Devices
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Row hammer-induced D0 failure improvement in sub-20 nm DRAM using an air gap

  • Yoon, Jiyeong ; 
  • Yoon, Seokchan ; 
  • Ahn, Jinho ; 
  • Shin, Changhwan
  • 2024-12
  • Semiconductor Science and Technology
  • IOP Publishing Ltd
Article

Enhancing performance of microbolometers by utilizing low-temperature polycrystalline silicon

  • Jung, Taeseung ; 
  • Kim, Seungyeob ; 
  • Lee, Sangho ; 
  • Ahn, Jinho ; 
  • Jeon, Sanghun
  • 2024-12
  • Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics
  • A V S AMER INST PHYSICS
Article

Enhanced performance of hafnia self-rectifying ferroelectric tunnel junctions at cryogenic temperatures

  • Hwang, Junghyeon ; 
  • Kim, Chaeheon ; 
  • Ahn, Jinho ; 
  • Jeon, Sanghun
  • 2024-12
  • NANO CONVERGENCE
  • SPRINGER
Article

Optimizing De-trap Pulses in Gate-injection Type Ferroelectric NAND Cells to Minimize Read After Write Delay Issue

  • Kim, Giuk ; 
  • Choi, Hyojun ; 
  • Cho, Hongrae ; 
  • Lee, Sangho ; 
  • Shin, Hunbeom ; 
  • ... Ahn, Jinho ; 
  • 외 11명
  • 2024-12
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Experimental Analysis on the Interaction Between Interface Trap Charges and Polarization on the Memory Window of Metal-Ferroelectric-Insulator-Si (MFIS) FeFET

  • Kim, Giuk ; 
  • Choi, Hyojun ; 
  • Lee, Sangho ; 
  • Shin, Hunbeom ; 
  • Lee, Sangmok ; 
  • ... Ahn, Jinho ; 
  • 외 9명
  • 2024-11
  • IEEE Transactions on Electron Devices
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC