권대웅 프로필 사진

권대웅

Kwon, Daewoong

공과대학

융합전자공학부

Web Of Science Scopus

자료 필터

자료유형

발행연도

2023 ~ 2026
2023 2026

키워드

언어

전체 82건 중 21번부터 30번까지의 결과를 표시합니다.

2026
Article

Structure-modulated phase stability and defect engineering in ferroelectric HfxZr1-xO2 heterostructures(vol 200 ,109995 , 2025)

  • Han, Changhyeon ; 
  • Kwak, Been ; 
  • Choi, Joonhyeok ; 
  • Kwon, Hyucknam ; 
  • Kwon, Ki-Ryun ; 
  • ... Kwon, Daewoong ; 
  • 외 1명
  • 2026-01
  • Materials Science in Semiconductor Processing
  • ELSEVIER SCI LTD
Article

Quantitative Analysis on the Interaction Between Channel Carrier and Remote Trap in HfxZr1-xO2/SiO2 Interface in Ferroelectric Field-Effect-Transistor

  • Lee, Haneul ; 
  • Kim, Sujong ; 
  • Han, Changhyeon ; 
  • Kim, Haesung ; 
  • Yang, Hyojin ; 
  • ... Kwon, Daewoong ; 
  • 외 7명
  • 2026-01
  • Advanced Electronic Materials
  • WILEY
Article

First demonstration of federated learning with homomorphic encryption using vertically-stacked ferroelectric tunnel junction

  • Kim, Jeong-Han ; 
  • Im, Jiseong ; 
  • Song, Minsuk ; 
  • Yoo, Yelin ; 
  • Lee, Jongwoo ; 
  • ... Kwon, Daewoong ; 
  • 외 2명
  • 2026-01
  • Technical Digest - International Electron Devices Meeting
Article

Physical Reservoir Computing System via Hybrid Ferroelectric-Ionic Transistors

  • Koo, Ryun-Han ; 
  • Han, Changhyeon ; 
  • Yim, Jiyong ; 
  • Im, Jiseong ; 
  • Cho, Youngchan ; 
  • ... Kwon, Daewoong ; 
  • 외 4명
  • 2026-01
  • Advanced Materials
  • WILEY-V C H VERLAG GMBH
2025
Article

Structure-modulated phase stability and defect engineering in ferroelectric HfxZr1-xO2 heterostructures

  • Han, Changhyeon ; 
  • Kwak, Been ; 
  • Choi, Joonhyeok ; 
  • Kwon, Hyucknam ; 
  • Kwon, Ki-Ryun ; 
  • ... Kwon, Daewoong ; 
  • 외 1명
  • 2025-12
  • Materials Science in Semiconductor Processing
  • ELSEVIER SCI LTD
Article

Synergistic Modulation of Polarization and Leakage Current in MPB-HZO Capacitors via TiO2 Interlayer

  • Han, Changhyeon ; 
  • Kwak, Been ; 
  • Choi, Joonhyeok ; 
  • Park, Sung-Wook ; 
  • Yu, Dahye ; 
  • ... Kwon, Daewoong ; 
  • 외 2명
  • 2025-11
  • Advanced Electronic Materials
  • WILEY
Article

The Impact of Through Silicon Metal(TSM) contact on Performance and thermal reliability in CFET

  • 2025-10
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Unraveling ionic switching dynamics in high-k dielectric double-gate transistors via low-frequency noise spectroscopy

  • Jeong, Soi ; 
  • Han, Chang-Hyeon ; 
  • Kwak, Been ; 
  • Koo, Ryun-Han ; 
  • Cho, Youngchan ; 
  • ... Kwon, Daewoong ; 
  • 외 3명
  • 2025-10
  • NANO CONVERGENCE
  • SPRINGER
Article

A universal re-annealing method for enhancing endurance in hafnia ferroelectric memories: Insights from stochastic noise analysis

  • Koo, Ryun-Han ; 
  • Shin, Wonjun ; 
  • Im, Jiseong ; 
  • Ryu, Sangwoo ; 
  • Kim, Seungwhan ; 
  • ... Kwon, Daewoong ; 
  • 외 9명
  • 2025-10
  • Chaos, Solitons & Fractals
  • PERGAMON-ELSEVIER SCIENCE LTD
Article

Interface percolation and random trap generation in ferroelectric memory: A two-step degradation mechanism explored through low-frequency noise spectroscopy

  • Koo, Ryun-Han ; 
  • Shin, Wonjun ; 
  • Im, Jiseong ; 
  • Kim, Seungwhan ; 
  • Ryu, Sangwoo ; 
  • ... Kwon, Daewoong ; 
  • 외 7명
  • 2025-10
  • Chaos, Solitons & Fractals
  • PERGAMON-ELSEVIER SCIENCE LTD