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자료 필터
자료유형
발행연도
2008 ~ 2026
2008 2026
키워드
언어
전체 228건 중 11번부터 20번까지의 결과를 표시합니다.
2024
Article
A Novel 3D Gate-All-Around Vertical FeFET with Back-Gate Structure for Disturbance-Less Program Operation
- Ku, Boncheol ;
- Sim, Jae-Min ;
- Hur, Jae Seok ;
- Jeong, Jae Kyeong ;
- Song, Yun-Heub ;
- ... Choi, Changhwan
- 2024-05
- 2024 IEEE INTERNATIONAL MEMORY WORKSHOP, IMW
- IEEE
Article
An Optimized Device Structure with a Highly Stable Process Using Ferroelectric Memory in 3D NAND Flash Memory Applications
- Choi, Seonjun ;
- Kang, Myounggon ;
- Jung, Hong-Sik ;
- Kim, Yuri ;
- Song, Yun-Heub
- 2024-03
- ELECTRONICS
- MDPI
Article
Concave and Convex Structures for Advanced 3-D NAND Flash Memory Technology
- Song, Jiho ;
- Sim, Jae-Min ;
- Kim, Beomsu ;
- Song, Yun-Heub
- 2024-02
- IEEE Transactions on Electron Devices
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Direct observation of phase-change volume in contact resistance change memory using N-doped Cr2Ge2Te6 phase-change material
- Shuang, Yi ;
- Ando, Daisuke ;
- Song, Yunheub ;
- Sutou, Yuji
- 2024-02
- Applied Physics Letters
- AIP Publishing
Article
An Optimized Device Structure with Improved Erase Operation within the Indium Gallium Zinc Oxide Channel in Three-Dimensional NAND Flash Applications
- Choi, Seonjun ;
- Park, Jin-Seong ;
- Kang, Myounggon ;
- Jung, Hong-sik ;
- Song, Yun-heub ;
- 외 1명
- 2024-01
- ELECTRONICS
- MDPI
Article
High Mobility and GIDL Erase-Compatible Characteristics in Hybrid Channel (Poly-Si/IGO) for Ultrahigh 3D NAND Flash Memory Applications
- Sim, Jae-Min ;
- Choi, Su-Hwan ;
- Ryu, Seong-Hwan ;
- Song, Ji-Ho ;
- Park, Jin-Seong ;
- ... Song, Yun-Heub
- 2024-01
- ACS APPLIED ELECTRONIC MATERIALS
- AMER CHEMICAL SOC
2023
Article
An Improved Structure Enabling Hole Erase Operation When Using an IGZO Channel in a 3D NAND Flash Structure to Which COP (Cell-On-Peri) Structure Is Applied
- Choi, Seonjun ;
- Kang, Myounggon ;
- Song, Yun-Heub
- 2023-07
- ELECTRONICS
- MDPI
Conference
'A Novel Gate-All-Around with Back-gate (GAAB) Structure with Highly Scalable in 3-D NAND Flash Memory' 연구 발표
- 2023-06-28
Conference
'Study on Program Characteristics According to Trap Profile in 3D NAND Flash Memory' 연구 발표
- 2023-06-28
Article
Mechanical stress in a tapered channel hole of 3D NAND flash memory
- Yoon, Dong Gwan ;
- Sim, Jae Min ;
- Song, Yun Heub
- 2023-04
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD