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자료 필터
자료유형
발행연도
2008 ~ 2026
2008 2026
키워드
언어
전체 228건 중 81번부터 90번까지의 결과를 표시합니다.
2019
Article
Magnetostrictive Performance of Electrodeposited TBXDY(1-X)FEY Thin Filmevaluated from Microactuator
- Shim, Hang ;
- Sakamoto, Kei ;
- Inomata, Naoki ;
- Toda, Masaya ;
- Toan,Nguyen Van ;
- ... Song, Yun Heub ;
- 외 1명
- 2019-06
- International Solid-State Sensors, Actuators and Microsystems Conference
- IEEE
Article
Nanoelectromechanical Logical Gates Utilising Selective Tungsten Chemical Vapor Deposition
- Toan, Nguyen Van ;
- Zhao, Dong ;
- Inomata, Naoki ;
- Toda, Masaya ;
- Song, Yun Heub ;
- 외 1명
- 2019-06
- International Solid-State Sensors, Actuators and Microsystems Conference
- IEEE
Conference
Simulation study on the WL interference by vertical scaling in the 3D NAND flash memories
- 2019-05-09
Article
Novel current-mirror based time dependent sense scheme for MLC PRAM
- Choi, Jun-Tae ;
- Kweon, Jun-Young ;
- Song, YunHeub ;
- Kim, Tony Tae-Hyoung
- 2019-05
- ICEIC 2019 - International Conference on Electronics, Information, and Communication
- Institute of Electrical and Electronics Engineers Inc.
Article
Investigation of the Impact of External Stress on Memory Characteristics by Modifying the Backside of Substrate
- Oh, Young-Taek ;
- Sim, Jae-Min ;
- Nguyen Van Toan ;
- Kino, Hisashi ;
- Ono, Takahito ;
- ... Song, Yun Heub ;
- 외 1명
- 2019-04
- IEEE Transactions on Electron Devices
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Comparative Study on Performance of IGZO Transistors With Sputtered and Atomic Layer Deposited Channel Layer
- Cho, Min Hoe ;
- Seol, Hyunju ;
- Song, Aeran ;
- Choi, Seonjun ;
- Song, Yun Heub ;
- ... Jeong, Jae Kyeong ;
- 외 4명
- 2019-04
- IEEE Transactions on Electron Devices
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Development of PCM and OTS Macro-models for HSPICE Compatible Simulation
- Choi,Jun tae ;
- An, Byung kwon ;
- Kim, Tony Tae-Hyoung ;
- Song, Yun Heub
- 2019-03
- 2019 Electron Devices Technology and Manufacturing Conference, EDTM 2019
- Institute of Electrical and Electronics Engineers Inc.
Conference
Investigation of the effect of metal gate stress on cell characteristics in MONOS device
- 2019-02-13