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자료 필터
자료유형
발행연도
2010 ~ 2026
2010 2026
키워드
언어
전체 750건 중 91번부터 100번까지의 결과를 표시합니다.
2025
Article
Multi-scale (Macro-Meso-Micro) Progressive Failure Simulation of the Carbon Fiber Braided Structure Under Quasi-static Mechanical Loading
- Lee, Se-Min ;
- Baek, Jeong-Hyeon ;
- Yu, Myeong-Hyeon ;
- Jeon, Seong-Wook ;
- Choi, Woo-Seok ;
- ... Park, Jun-Hong ;
- ... Kim, Hak-Sung ;
- 외 2명
- 2025-09
- International Journal of Precision Engineering and Manufacturing-Green Technology
- KOREAN SOC PRECISION ENG
Article
Synergistic role of Bi, Ni, and Pd alloying in SAC305 for enhanced IMC suppression and superior thermo-mechanical performance
- Kim, You-Gwon ;
- Kim, Heon-Su ;
- Kim, Tae-Wan ;
- Park, Hyeong-Bin ;
- Park, Jong-Whi ;
- ... Kim, Hak-Sung ;
- 외 4명
- 2025-09
- Journal of Materials Research and Technology
- ELSEVIER
Article
Effect of geometric configurations and heat treatment on the tensile properties, joint performance, and failure behavior of 3D-Printed carbon and glass fiber composites
- Kumar, Sanjay ;
- Yoo, Dong-Hoon ;
- Song, Jun-Seop ;
- Kim, Hak-Sung
- 2025-09
- Composites Part B: Engineering
- ELSEVIER SCI LTD
Article
Measurement of interfacial adhesion strength of Copper-Silicon based dielectric interfaces via laser spallation test
- Ju, Young-Min ;
- Kim, Dukyong ;
- Lee, Se-Min ;
- Kim, Heuisu ;
- Lee, Daewoong ;
- ... Lee, Seung Hwan ;
- ... Kim, Hak-Sung ;
- 외 1명
- 2025-08
- APPLIED SURFACE SCIENCE ADVANCES
- ELSEVIER
Article
Advanced WBG power semiconductor packaging: nanomaterials and nanotechnologies for high-performance die attach paste
- Ju, Young-Min ;
- Kim, Tae-Wan ;
- Lee, Seung-Hyun ;
- Lee, Ho-Jin ;
- Ahn, Jinho ;
- ... Kim, Hak-Sung
- 2025-07
- NANO CONVERGENCE
- SPRINGER
Article
Ultra-Millisecond Flip-Chip Bonding Process via Intense Pulsed Light Irradiation
- Ju, Young-Min ;
- Ryu, Seong-Ung ;
- Park, Jong-Whi ;
- Kim, Hak-Sung
- 2025-07
- ACS Applied Materials & Interfaces
- AMER CHEMICAL SOC
Conference
Study on Through-Glass Via (TGV) Filling Using Bimodal Copper Ink and Impact on Electrical Reliability
- 2025-06-27